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Revolutionize Your Semiconductor Metrology with Dimension 9000 Series AFM.

Achieve unparalleled precision and efficiency with the Dimension 9000 - your fully automated, fab-ready Atomic Force Microscope designed for modern semiconductor processes.

Why Choose the Dimension 9000?

   •      Unmatched Precision: Sub-nanometer resolution for features down to 0.18µm and below.

   •      Fully Automated: Push-button operation with automated tip evaluation and exchange.

   •      Versatile Applications: Perfect for etch trench/recess measurements, DRAM process control, HSG analysis, defect characterization, and more.

   •      High Throughput: Analyze up to 40 wafer sites per hour with recipe-driven workflows.

   •      Non-Destructive Analysis: Safeguard yields with accurate 3D measurements without damaging wafers.

Key Features:

   •      TipX™ Automatic Tip Exchange: No operator intervention needed.

   •      NanoScript™ Automation: Simplify scanning, measurement, and reporting.

   •      Advanced Defect Characterization: Integrated optics and TappingMode™ for superior defect insights.

   •      Compact Design: Cleanroom-compatible with integrated acoustic and vibration isolation.

Fully Serviced and Warranty Included! 

This tool has been fully serviced, calibrated, and includes a comprehensive warranty for your peace of mind.

Boost yields, reduce costs, and ensure process excellence with the Dimension 9000 Series - field-proven by semiconductor leaders worldwide.